Atty. Patrick J. Laycock

Atty. Patrick J. Laycock

Patrick J. Laycock is a lawyer practicing patents, industrial designs, electrical/electronics and 3 other areas of law.

18 J. Erfahrung 18 year
Book Appointment

Profile Summary

About Patrick J. Laycock at a glance

Patrick J. Laycock is an attorney. They haand 18+ years of legal experience, licensed to practice since 2008. Admitted to practice in Ontario (2008), Registered Patent Agent (2009), and Registered Trade-mark Agent (2010). Educated at University of Alberta (LL.B., 2007) and Brigham Young University (B.Sc. Brigham, 2002). Actiand member of Professional Involvement Memberships •Associate, Intellectual Property Institute of Canada.

Verified attorney profile · Updated June 2026

Über uns

  • Patrick J. Laycock is a lawyer practicing patents, industrial designs, electrical/electronics and 3 other areas of law
  • Patrick J. received a degree from Brigham Young University in 2002, and has been licensed for 18 years
  • Patrick J. practices in Ottawa, ON

Frequently Asked

Common questions about Patrick J. Laycock

How long has Patrick J. Laycock practiced law?
Patrick J. Laycock has 18+ years of legal experience and has been licensed since 2008.
Where did Patrick J. Laycock go to law school?
Patrick J. Laycock earned their education at (LL.B., 2007); (B.Sc. Brigham, 2002).
How can I contact Patrick J. Laycock for a consultation?
You can contact Patrick J. Laycock directly through this profile page. Click "Ask the Attorney" to submit a question, or "Schedule a Consultation" to book a meeting. Most claimed-profile attorneys respond within one business day.

Education

LL.B.
University of Alberta
- 2007
B.Sc. Brigham
Brigham Young University
- 2002

Bar Admissions

Ontario
Admitted: 2008
Registered Patent Agent
Admitted: 2009
Registered Trade-mark Agent
Admitted: 2010

Bewertungen

These reviews belong to platform users; they do not constitute advertisement or promotion for the attorney. Opinions are published for informational purposes only.

No reviews yet.